Novel time-resolved atomic force microscopy technique captures ultrafast light-induced phenomena
Published Date: 1/31/2024
Source: phys.org
Despite remarkable progress in science and technology, rapid advancements have exposed limitations in many technological domains. A pressing challenge in semiconductor devices, which underpin ultrahigh-speed communications and artificial intelligence (AI), is the development of high-performance devices with a basic structure of 2 nanometers (nm).